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Automatic Measurement System

ETAC's original automatic measurement system allows continuous measurement without removing specimens from the chamber.

Our ion migration evaluation system "SIR series", which was first released in 1994 for the first time in Japan, has been considered by many customers as the industry standard through four upgrades. Since then, we have continually launched new products such as the multipoint, micro resistance measurement system called the "MLR series", the oxide film evaluation system "TDDB", and the insulating property evaluation system "TCI series", in order to correspond to the latest needs with an excellent practicality not shared by other commercial electronic measurement instruments.
SIR13 Insulation degradation evaluation system
SIR 13 imageLatest version of the industry standard system that can serve for three different purposes
This system allows the user to accurately detect the beginning point of ion migration which is the typical phenomenon of insulation degradation. The versatile 3-way system performs insulation degradation evaluations, insulation resistance measurements, and insulating property evaluations. It is best suited for ion migration evaluations of wash-free, condensation-free, lead-free solders and also for insulation reliability evaluations of interposers for high density packages or build-up printed circuit boards.
SIR 13 Specification
MLR22 Conduction Reliability Evaluation System (AC/DC compatible)
MLR 22 imageThe system caters to both continuous AC measurements and DC four-wire Kelvin Bridge measurements without removing specimens from the chamber.
Evolving from a DC only measurement system, MLR 22 was developed as the AC/DC 2-way, micro resistance measurement system that continuously measures the micro resistance of the specimen inside the chamber. Now, the system allows joint reliability evaluations using the actual devices or electric conduction reliability evaluations of the surface mount board for automotive devices which must be performed by using DC. A PC controls both the MLR22 and the chamber while providing various data such as temperature (humidity), resistance value, and Weibull plot.
MLR 22 Specification
ED 70S Event Detector
ED 70S imageFast and continuous measurement of resistance for multi-channels
This device detects changes in resistance at high speed (200nS), while continuously measuring widely fluctuating resistance for multi-channels. The resistance can be measured by synchronizing with the temperature cycle test chamber. The device is best used for detecting defective solder balls (IPC9701 compliant), loose connections on a connector through connection/disconnection testing, and also chattering of relays or switches at an early stage.
ED 70S Specification
TCI 50 Highly Acclerated Life Testing System
TCI 50 imageAutomatically measures insulating property of electronic components with capacitance.
This system automatically measures leakage of current, insulation resistance, and temperature/humidity of capacitors, LC filters, etc. which have capacitance, and it stores measurement values and elapsed time data. Stress voltage and measurement voltage can be set separately. A measurement jig (for 1005) for setting specimens and a special rack are included.
TCI 50 Specification
MCL 41 Capacitor (temperature) Characteristics Evaluation System
MCL 41 imageContinuously and automatically measures major characteristics of a capacitor
This system automatically measures major characteristics of a capacitor such as electrostatic capacity, Tandelta, impedance, and temperature. The measurement instrument and scanners produced by Agilent Technologies are combined with our temperature test chamber. In addition, ETAC's user-friendly, original special software is included.
MCL 41 Specification
TLE 60 Capacitor Life Test System
TLE 60 imageCapacitor life tests that require many hours of testing is now fully automated
This system boasts a high-power design with maximum voltage and a current of 500V and 50mA per channel. It performs automated, highly accurate capacitor life tests. Different voltage can be applied by channel (20 capacitors can be measured per channel) and electric current can be measured at desired time intervals. It is a complete automatic measurement system that comes with a measurement jig, a high temperature oven, and special software.
TLE 60 Specification
TDDB Oxide Film Reliability Evaluation System
TDDB imageSimultaneously performs gate oxide reliability evaluation for multiple specimens
This device was developed to carry out gate oxide reliability evaluations using the TDDB (Time-Dependent Dielectric Breakdown) method. As each channel has its own power source, evaluations of electric field dependence or current density dependence to each gate oxide can be performed simultaneously for multiple specimens, while different test conditions can be set for every specimen. It can be connected to a manual prober, a constant temperature chamber, and a fully-automatic prober.
TDDB Specification
EM Tester Electromigration Evaluation System
EM imageHeavy-current application and highly accurate evaluation were made possible for EM evaluation
Two models are available. These are the V100 model which, when combined with a compact EM oven evaluates large amount of TEGs (Test Element Group) simultaneously with different test conditions and the V200 model which, when combined with a DHS (Direct Heating System) evaluates high temperature, accelerated stress of up to 300°C. Both systems can perform highly accurate evaluations of electromigration behavior, which is one of the interconnection evaluations, by applying heavy current.
EM Specification
GMR GMR Head Reliability Evaluation System
GMR imageElectromigration device for GMR heads
This system performs highly accurate evaluation of electromigration behavior of GMR heads which are used for the sensor unit of a hard disc device (HDD). In order to protect GMR film, it is designed to prevent electrostatic discharge (ESD) when specimens are connected/disconnected. The system is able to evaluate DIP 28 pins (600 mil wide) and HGA.
GMR Specification
SBT 50 Secondary Cell Charge/Discharge Test System
SBT 50 imageEnables automation of charge/discharge tests, material development, and labor-saving of characteristics tests
This is an automatic measurement system which performs highly accurate characteristics evaluations of secondary cells such as a lithium-ion batteries and nickel metal-hydride batteries, or evaluation of newly developed materials. It can be used for various purposes such as charging/discharging constant current, constant voltage, constant power, and pulse.
SBT 50 Specification

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